Patent · US Expired

Method and system for semiconductor crystal production with temperature management

US7135073B2 · kind B2 · utility

7Cited by
11References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 1, 2001
Grant dateNov 14, 2006
Priority date
Expiry dateJul 18, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/0217
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

What is described here is a method and a temperature management and reaction chamber system for the production of nitrogenous semiconductor crystal materials of the form AXBYCZNVMW, wherein A, B, C represent elements of group II or III, N represents nitrogen, M represents an element of group V or VI, and X, Y, Z, V, W represent the mol fraction of each element in this compound, operating on the basis of gas phase compositions and gas phase successions. The invention excels itself by the provisions that for the production of the semiconductor crystal materials the production process is controlled by the precise temperature control of defined positions in the reaction chamber system under predetermined conditions.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.