Method and system for semiconductor crystal production with temperature management
US7135073B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 1, 2001 |
| Grant date | Nov 14, 2006 |
| Priority date | — |
| Expiry date | Jul 18, 2021 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L21/0217
- WIPO fieldSurface technology, coating
- WIPO sectorChemistry
Abstract
What is described here is a method and a temperature management and reaction chamber system for the production of nitrogenous semiconductor crystal materials of the form AXBYCZNVMW, wherein A, B, C represent elements of group II or III, N represents nitrogen, M represents an element of group V or VI, and X, Y, Z, V, W represent the mol fraction of each element in this compound, operating on the basis of gas phase compositions and gas phase successions. The invention excels itself by the provisions that for the production of the semiconductor crystal materials the production process is controlled by the precise temperature control of defined positions in the reaction chamber system under predetermined conditions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.