Patent · US Expired

In-wafer testing of integrated optical components in photonic integrated circuits (PICs)

US7135382B2 · kind B2 · utility

6Cited by
15References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 16, 2004
Grant dateNov 14, 2006
Priority date—
Expiry dateDec 16, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01S5/4087
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

Disclosed is a method of in-wafer testing of integrated optical components and in-wafer chips with photonic integrated circuits (PICs).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.