Patent · US Expired

Integrated power devices and signal isolation structure

US7135766B1 · kind B1 · utility

90Cited by
14References
27Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 30, 2004
Grant dateNov 14, 2006
Priority date
Expiry dateNov 30, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/3025
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A flip chip power device having an integrated low inductance ground and heat sink path and an isolation structure is provided. A substrate is formed having transistors and an ohmic contact region circumscribing the transistors. Dielectric layers are formed on the substrate, and a common metal layer is formed on the dielectric layers. An isolation metal layer is formed on the dielectric layers above the ohmic contact region. The common metal layer is coupled to a first region of each of the transistors, and the isolation metal layer is coupled to the ohmic contact region. A first bump is formed on the common metal layer, and a second bump is formed on the isolation metal layer. When the power device is attached to a second substrate, the first bump forms a low inductance ground and heat sink path to the second substrate, and an isolation structure is formed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.