Patent · US Expired

Method and apparatus of monitoring and controlling the emission wavelengths of a plurality of laser sources integrated on the same chip or in the same photonic integrated circuit (PIC)

US7136546B2 · kind B2 · utility

13Cited by
68References
53Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 28, 2006
Grant dateNov 14, 2006
Priority date
Expiry dateMar 28, 2026

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01S5/50
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A method and apparatus operates an array of laser sources as an integrated array on a single substrate or as integrated in an optical transmitter photonic integrated circuit (TxPIC) maintaining the emission wavelengths of such integrated laser sources at their targeted emission wavelengths or at least to more approximate their desired respective emission wavelengths. Wavelength changing elements may accompany the laser sources to bring about the change in their operational or emission wavelength to be corrected to or toward the desired or target emission wavelength. The wavelength changing elements may be comprise of temperature changing elements, current and voltage changing elements or bandgap changing elements. Identification tags in the form of low frequency tones may be applied relative to respective laser source outputs with a different frequency assigned to each laser source so that each laser can be specifically identified in a feedback control for providing correction signals to the wavelength changing elements to correct for the emission wavelength of respective laser sources.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.