Patent · US Expired

Algoristic spring as probe

US7148713B1 · kind B1 · utility

7Cited by
8References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 28, 2005
Grant dateDec 12, 2006
Priority date
Expiry dateOct 28, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R1/07314
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A contact probe including a length of wire with head, coil and tail sections. The head and tail sections may be lengthened and offset from the longitudinal axis of the coil section to allow the probes to be densely packed in a substrate material. Two probes may be interleaved to provide improved electrical performance of the probe.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.