Patent · US Expired

Method and apparatus for determination of the depth of depressions which are formed in a mount substrate

US7152461B2 · kind B2 · utility

5Cited by
9References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 17, 2005
Grant dateDec 26, 2006
Priority date
Expiry dateApr 14, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N5/04
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The invention relates to a method for determination of the depth of depressions which are formed in a mount substrate. According to the invention, an essentially uniform layer of a wetting agent is applied, which contains depressions, on a surface of the mount substrate, a time profile of the decrease in weight of the mount substrate is recorded, and the recorded time profile of the decrease in weight of the mount substrate is evaluated. The invention also relates to a measurement apparatus.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.