Dual tapered spring probe
US7154286B1 · kind B1 · utility
23Cited by
32References
6Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 30, 2005 |
| Grant date | Dec 26, 2006 |
| Priority date | — |
| Expiry date | Jun 30, 2025 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01R2201/20
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A contact spring probe includes a plunger and a spring with a pair of opposed closed coils separated by an open coil. The plunger is secured at one end to one set of closed coils with a shoulder, flange or barb extending from the body of the plunger.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.