Method and system for calibrating a measurement device path and for measuring a device under test in the calibrated measurement device path
US7157918B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | May 23, 2005 |
| Grant date | Jan 2, 2007 |
| Priority date | — |
| Expiry date | Jul 30, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R35/005
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and system of calibrating first and second adapters comprises the steps of calibrating coaxial ports of a vector network analyzer to traceable standards and connecting a symmetrical through circuit path between the coaxial ports. The through circuit path comprises a cascaded combination of the first and second adapters. The first adapter is passive and substantially identical to the second adapter and uncascaded first and second adapters comprise a measurement device path. The through circuit path and the measurement device path have substantially equivalent S-parameters. S-parameters of the through circuit path are measured and then the first and second adapters are characterized based upon the measured S-parameters. The method and system may be applied to two port adapters and devices under test and may also be scaled for multi-port adapters and devices under test.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.