Patent · US Expired

Method and apparatus for calibrating a delay line

US7157948B2 · kind B2 · utility

18Cited by
10References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 10, 2004
Grant dateJan 2, 2007
Priority date
Expiry dateSep 28, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03L7/085
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A delay line calibration circuit and method are provided in which a programmable master delay line drives a delay clock and has a propagation delay that is a function of a delay setting. A delay counter is clocked by the delay clock and has a delay count. A reference counter is clocked by a reference clock and has a reference count. A control circuit controls the delay and reference counters, compares a representation of the delay count to a representation of the reference count and responsively generates a modified value for the delay setting to reduce a difference between the representations of delay count and the reference count.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.