Patent · US Expired

Electrochemically fabricated hermetically sealed microstructures and methods of and apparatus for producing such structures

US7160429B2 · kind B2 · utility

29Cited by
2References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 7, 2003
Grant dateJan 9, 2007
Priority date
Expiry dateMay 7, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH05K3/4647
  • WIPO fieldTelecommunications
  • WIPO sectorElectrical engineering

Abstract

In some embodiments, multilayer structures are electrochemically fabricated from at least one structural material (e.g. nickel), at least one sacrificial material (e.g. copper), and at least one sealing material (e.g. solder). In some embodiments, the layered structure is made to have a desired configuration which is at least partially and immediately surrounded by sacrificial material which is in turn surrounded almost entirely by structural material. The surrounding structural material includes openings in the surface through which etchant can attack and remove trapped sacrificial material found within. Sealing material is located near the openings. After removal of the sacrificial material, the box is evacuated or filled with a desired gas or liquid. Thereafter, the sealing material is made to flow, seal the openings, and resolidify. In other embodiments, a post-layer formation lid or other enclosure completing structure is added.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.