Inventor · Boulder Creek, CA, US

Michael S. Lockard

74Patents
21h-index
50Co-inventors
91Inventor score

Filing activity: Jun 13, 1997 → Apr 18, 2022

Most-cited inventions

PatentTitleAreaCited byStatus
US6193923A Selective deposition modeling method and apparatus for forming three-dimensional objects and supports Performing Operations; Transporting 275 Expired
US7830228B2 Miniature RF and microwave components and methods for fabricating such components Emerging Cross-Sectional Technologies 233 Active
US6305769A Selective deposition modeling system and method Performing Operations; Transporting 164 Expired
US6270335A Selective deposition modeling method and apparatus for forming three-dimensional objects and supports Performing Operations; Transporting 123 Expired
US7077638B2 Selective deposition modeling method and apparatus for forming three-dimensional objects and supports Performing Operations; Transporting 121 Expired
US6660209B2 Selective deposition modeling method and apparatus for forming three-dimensional objects and supports Performing Operations; Transporting 113 Expired
US7239219B2 Miniature RF and microwave components and methods for fabricating such components Electricity 112 Expired
US6508971B2 Selective deposition modeling method and apparatus for forming three-dimensional objects and supports Performing Operations; Transporting 110 Expired
US5989476A Process of making a molded refractory article Emerging Cross-Sectional Technologies 94 Expired
US7259640B2 Miniature RF and microwave components and methods for fabricating such components Emerging Cross-Sectional Technologies 82 Expired
US7611616B2 Mesoscale and microscale device fabrication methods using split structures and alignment elements Emerging Cross-Sectional Technologies 45 Active
US7195989B2 Electrochemical fabrication methods using transfer plating of masks Electricity 37 Expired
US7412767B2 Microprobe tips and methods for making Emerging Cross-Sectional Technologies 36 Expired
US7531077B2 Electrochemical fabrication process for forming multilayer multimaterial microprobe structures Physics 35 Active
US7109118B2 Electrochemical fabrication methods including use of surface treatments to reduce overplating and/or planarization during formation of multi-layer three-dimensional structures Electricity 35 Expired
US7160429B2 Electrochemically fabricated hermetically sealed microstructures and methods of and apparatus for producing such structures Electricity 29 Expired
US7273812B2 Microprobe tips and methods for making Emerging Cross-Sectional Technologies 28 Expired
US6224816A Molding method, apparatus, and device including use of powder metal technology for forming a molding tool with thermal control elements Performing Operations; Transporting 27 Expired
US7288178B2 Methods of and apparatus for making high aspect ratio microelectromechanical structures Electricity 23 Expired
US7271888B2 Method and apparatus for maintaining parallelism of layers and/or achieving desired thicknesses of layers during the electrochemical fabrication of structures Emerging Cross-Sectional Technologies 23 Expired
US7501328B2 Methods for electrochemically fabricating structures using adhered masks, incorporating dielectric sheets, and/or seed layers that are partially removed via planarization Emerging Cross-Sectional Technologies 22 Active
US7498714B2 Multi-layer three-dimensional structures having features smaller than a minimum feature size associated with the formation of individual layers Emerging Cross-Sectional Technologies 21 Expired
US7363705B2 Method of making a contact Emerging Cross-Sectional Technologies 19 Expired
US8613846B2 Multi-layer, multi-material fabrication methods for producing micro-scale and millimeter-scale devices with enhanced electrical and/or mechanical properties Electricity 19 Active
US9671429B2 Multi-layer, multi-material micro-scale and millimeter-scale devices with enhanced electrical and/or mechanical properties Emerging Cross-Sectional Technologies 17 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.