Patent · US Expired

Ion mobility spectrometer

US7164122B2 · kind B2 · utility

20Cited by
22References
92Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 18, 2005
Grant dateJan 16, 2007
Priority date
Expiry dateJul 9, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J49/401
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The present invention relates to an improved ion mobility spectrometer and method for the analysis of chemical samples. The improvements are realized in the optimization of resolution and sensitivity. Increases in sensitivity are realized by preserving a narrow spatial distribution of migrating ions through the use of periodic/hyperbolic field focusing. Use of a plurality of drift cells and a new RF field focusing interface are discussed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.