Patent · US Expired

Mass spectrometric apparatus and ion source

US7164124B2 · kind B2 · utility

3Cited by
5References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 13, 2004
Grant dateJan 16, 2007
Priority date
Expiry dateDec 13, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J49/168
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A mass spectrometric apparatus capable of generating and detecting positive and negative ions stably at the same time. The apparatus preferably comprises: an opening through which a sample gas is introduced; an ion source to generate ions of the sample gas; and a mass spectrometer to analyze the mass of the generated ions. The ion source utilized with the mass spectrometric device comprises: a first needle electrode on which a voltage is applied in order to generate positive ions of the sample gas introduced through the opening; a first counter electrode having a first opening through which the sample gas and the positive ions pass; a second counter electrode disposed opposite the first counter electrode having a second opening through which the sample gas and the positive ions pass; a second needle electrode on which voltage is applied in order to generate negative ions of the sample gas; and a vent through which the sample gas is ejected. Generated ions are then introduced into a vacuum region via an aperture and subjected to mass analysis.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.