Depth of field enhancement for optical comparator
US7164470B2 · kind B2 · utility
0Cited by
3References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 14, 2003 |
| Grant date | Jan 16, 2007 |
| Priority date | — |
| Expiry date | Nov 23, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01M11/0207
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An optical device inspection system and method employing a narrow aperture on a magnifying objective lens in order to reduce the circle of confusion and increase the depth of field. The smaller aperture resulting in an increase in depth of field allows for simultaneous focus for all portions of objects being inspected. An arc lamp with an elliptical reflector in combination with a condenser lens focuses a more intense beam of light through the objective lens, thereby providing sufficient brightness without sacrificing any depth of field.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.