Patent · US Expired

Method for determining programmable coefficients to replicate frequency and supply voltage correlation in an integrated circuit

US7164998B2 · kind B2 · utility

1Cited by
10References
16Claims
0Family size

Assignee

Inventor

Key dates

Filing dateFeb 22, 2005
Grant dateJan 16, 2007
Priority date
Expiry dateMar 21, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/31718
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

One use for delay adjustment circuit (32), coarse-grain delay offset circuit (34), and fine grain delay systhesis circuit (36) may be as part of a delay replication circuit (30) used to replicate the frequency versus voltage behavior of an integrated circuit (29). Also, a circuit (30) and method for determining optimal power and frequency metrics of integrated circuit (29) is also described. In addition, a method for determining programmable coefficients to replicate frequency and supply voltage correlation is described.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.