Data-dependent jitter (DDJ) calibration methodology
US7164999B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 8, 2005 |
| Grant date | Jan 16, 2007 |
| Priority date | — |
| Expiry date | Nov 8, 2025 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L1/244
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
The present subject matter relates to methodologies for providing error correction compensation to measurement systems. Data-dependant jitter may be compensated by examining both short-term and long-term bit histories after applying a predetermined synthesized calibration pattern having selected characteristics to the measurement system. Neural networks may be provided to produce error correction signals that may be applied to measured data on a bit-by-bit basis to correct jitter. The synthesized calibration sequence may correspond to a base pattern having two segments; a first segment may correspond to a copy of the base pattern while the second segment may be a copy of the base pattern with some sections inverted.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.