Sassan Tabatabaei
46Patents
8h-index
17Co-inventors
72Inventor score
Filing activity: Sep 16, 2002 → Jun 17, 2024
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6754613B2 | High resolution time-to-digital converter | Physics | 52 | Expired |
| US7653849B1 | Input-output device testing including embedded tests | Physics | 40 | Active |
| US7598726B1 | Methods and apparatuses for test methodology of input-output circuits | Physics | 16 | Active |
| US7779319B1 | Input-output device testing including delay tests | Physics | 14 | Active |
| US7292947B1 | System and method of estimating phase noise based on measurement of phase jitter at multiple sampling frequencies | Physics | 14 | Active |
| US7203610B2 | System and method of obtaining data-dependent jitter (DDJ) estimates from measured signal data | Physics | 13 | Expired |
| US7590902B1 | Methods and apparatuses for external delay test of input-output circuits | Physics | 12 | Active |
| US10247621B1 | High resolution temperature sensor | Electricity | 9 | Active |
| US7400988B2 | Periodic jitter (PJ) measurement methodology | Electricity | 6 | Expired |
| US10594301B1 | Clock generator with dual-path temperature compensation | Electricity | 6 | Active |
| US7519888B2 | Input-output device testing | Physics | 6 | Active |
| US7164999B2 | Data-dependent jitter (DDJ) calibration methodology | Electricity | 6 | Expired |
| US7616036B1 | Programmable strobe and clock generator | Physics | 6 | Active |
| US8032806B1 | Input-output device testing including initializing and leakage testing input-output devices | Physics | 6 | Active |
| US7239969B2 | System and method of generating test signals with injected data-dependent jitter (DDJ) | Physics | 5 | Expired |
| US10622945B1 | Low Allan-Deviation oscillator | Electricity | 4 | Active |
| US10979031B1 | Clock generator with dual-path temperature compensation | Electricity | 4 | Active |
| US7512196B2 | System and method of obtaining random jitter estimates from measured signal data | Physics | 4 | Active |
| US7941287B2 | Periodic jitter (PJ) measurement methodology | Electricity | 3 | Active |
| US7856581B1 | Methods and apparatuses for external test methodology and initialization of input-output circuits | Physics | 3 | Active |
| US11228302B1 | Clock generator with dual-path temperature compensation | Electricity | 3 | Active |
| US11005422B1 | Low allan-deviation oscillator | Electricity | 3 | Active |
| US8225156B1 | Methods and apparatuses for external voltage test methodology of input-output circuits | Physics | 3 | Active |
| US11323071B1 | Low Allan-Deviation oscillator | Electricity | 2 | Active |
| US10622973B1 | Temperature sensor based on ratio of clock signals from respective MEMS resonators | Electricity | 2 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.