Test device for dynamic memory modules
US7165002B2 · kind B2 · utility
4Cited by
4References
11Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | May 31, 2002 |
| Grant date | Jan 16, 2007 |
| Priority date | — |
| Expiry date | Aug 2, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C11/401
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A test device for dynamic memory modules is described and has an electronic test unit for generating test signals. Accordingly, the electronic test unit has at least one electronic component for generating the test signals, and is configured for use on a personal computer mother board and contains at least one memory controller.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.