Method for calibrating the geometry of a multi-axis metrology system
US7173691B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 22, 2003 |
| Grant date | Feb 6, 2007 |
| Priority date | — |
| Expiry date | Dec 31, 2024 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB23Q17/2495
- WIPO fieldMachine tools
- WIPO sectorMechanical engineering
Abstract
A method for calibrating and aligning a metrology system comprising a machine including multi-axis part-positioning means and a wavefront-measuring gauge embedded in the machine. The gauge is used in determining spatial relationships among the translational and rotational axes, between part surface coordinates and machine coordinates, and between machine coordinates embedded gauge coordinates; in calibrating various components of the machine and the embedded gauge; and in aligning itself to the machine. A complete method comprises the steps of coarsely aligning the machine rotary axes with their respective translational axes and setting nominal zero points for the rotary axes; aligning the embedded gauge mainframe to the machine axes; aligning the embedded gauge focal point onto a spindle axis; determining the spatial offsets between the rotary axes when so aligned; precisely aligning the machine rotary axes with their respective translational axes; and setting precise zero points for the rotary axes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.