Jon Fleig
6Patents
4h-index
8Co-inventors
50Inventor score
Filing activity: Mar 24, 1993 → Nov 22, 2013
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5416586A | Method of testing aspherical optical surfaces with an interferometer | Physics | 35 | Expired |
| US7173691B2 | Method for calibrating the geometry of a multi-axis metrology system | Performing Operations; Transporting | 9 | Expired |
| US5724137A | Fringe pattern discriminator for interferometer using diffraction gratings | Physics | 6 | Expired |
| US7433057B2 | Method for accurate high-resolution measurements of aspheric surfaces | Physics | 5 | Active |
| US9097612B2 | Integrated wavefront sensor and profilometer | Physics | 3 | Active |
| US5349434A | Method of measuring artifact taper | Physics | 2 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.