Synchronization of multiple test instruments
US7177777B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 1, 2004 |
| Grant date | Feb 13, 2007 |
| Priority date | — |
| Expiry date | Dec 1, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31937
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test apparatus has multiple instruments that are synchronized with respect to one another so that a trigger signal may be generated in response to events occurring at different instruments. The events may correspond to events defined within a test program or events detected at a device under test. A partial trigger signal is generated by each of the different instruments, and the partial trigger signals are used in generating the trigger signal. Different offset delays are applied to the partial trigger signals so that the partial trigger signals generated by the different instruments are synchronized with respect to each other.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.