Patent · US Expired

Semiconductor memory device including 4TSRAMs

US7180768B2 · kind B2 · utility

3Cited by
5References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 29, 2004
Grant dateFeb 20, 2007
Priority date
Expiry dateJun 29, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C11/412
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Disclosed is a method of improving stability of a memory cell in read mode in an SRAM including a memory cell comprising two access MOS transistors and two drive MOS transistors. The magnitude of voltage between gate and source of an access transistor of a memory cell connected to a selected word line is controlled to be smaller than a power-supply voltage by controlling the voltage of selected word line WL in read mode.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.