Patent · US Expired

Semiconductor device and fabrication method therefor

US7183190B2 · kind B2 · utility

22Cited by
15References
1Claims
0Family size

Assignees

Inventors

Key dates

Filing dateMar 27, 2001
Grant dateFeb 27, 2007
Priority date
Expiry dateFeb 16, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/14
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method of efficiently and inexpensively fabricating a chip-size package having an electrode pitch expanded by forming a conductor wiring on the electrode forming surface side of a semiconductor chip, especially, a method for facilitating wiring and bump forming. A semiconductor device comprising a semi-conductor elements and conductor wirings formed on the semiconductor elements by etching wiring-forming metal foil; and a fabrication method for a semiconductor device comprising the steps of laminating wiring forming metal foil on the electrode forming surface side on the semiconductor, forming a resist wiring pattern on the metal foil, etching the metal foil, and slicing the device into individual elements.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.