Patent · US Expired

Method and system for controlling interchangeable components in a modular test system

US7184917B2 · kind B2 · utility

32Cited by
8References
26Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 13, 2004
Grant dateFeb 27, 2007
Priority date
Expiry dateDec 27, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/318342
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for integrating test modules in a modular test system is disclosed. The method includes controlling at least one test module and its corresponding device under test (DUT) with a controller, establishing a standard module control interface between a vendor-supplied test module and the modular test system with a module control framework, installing the vendor-supplied test module and a corresponding vendor-supplied control software module, where the vendor-supplied control software module is organized into a plurality of vendor-supplied module control components, configuring the modular test system based on the module control framework and the plurality of vendor-supplied module control components, and accessing the vendor-supplied test module in accordance with the plurality of vendor-supplied module control components using the module control framework.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.