Mark Elston
19Patents
7h-index
19Co-inventors
59Inventor score
Filing activity: Feb 6, 2004 → Aug 12, 2016
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7209851B2 | Method and structure to develop a test program for semiconductor integrated circuits | Physics | 32 | Expired |
| US7184917B2 | Method and system for controlling interchangeable components in a modular test system | Physics | 32 | Expired |
| US7197417B2 | Method and structure to develop a test program for semiconductor integrated circuits | Physics | 27 | Expired |
| US8082541B2 | Method and system for performing installation and configuration management of tester instrument modules | Physics | 15 | Active |
| US7210087B2 | Method and system for simulating a modular test system | Physics | 15 | Expired |
| US8255198B2 | Method and structure to develop a test program for semiconductor integrated circuits | Physics | 9 | Active |
| US7437261B2 | Method and apparatus for testing integrated circuits | Physics | 8 | Expired |
| US7430486B2 | Datalog support in a modular test system | Physics | 5 | Expired |
| US7197416B2 | Supporting calibration and diagnostics in an open architecture test system | Physics | 5 | Expired |
| US10158552B2 | Device profile-driven automation for cell-based test systems | Electricity | 5 | Active |
| US10548033B2 | Local portable test systems and methods | Electricity | 4 | Active |
| US7543200B2 | Method and system for scheduling tests in a parallel test system | Physics | 3 | Expired |
| US10251079B2 | Cloud-based services for management of cell-based test systems | Electricity | 3 | Active |
| US9785542B2 | Implementing edit and update functionality within a development environment used to compile test plans for automated semiconductor device testing | Physics | 2 | Active |
| US10681570B2 | Automated configurable portable test systems and methods | Electricity | 1 | Active |
| US9785526B2 | Automated generation of a test class pre-header from an interactive graphical user interface | Physics | 0 | Active |
| US10701571B2 | Automated validation and calibration portable test systems and methods | Electricity | 0 | Active |
| US9274911B2 | Using shared pins in a concurrent test execution environment | Physics | 0 | Active |
| US8214800B2 | Compact representation of vendor hardware module revisions in an open architecture test system | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.