Patent · US Expired

Compacting circuit responses

US7185253B2 · kind B2 · utility

23Cited by
7References
25Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 27, 2002
Grant dateFeb 27, 2007
Priority date
Expiry dateJun 16, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/318547
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Circuit responses to a stimulus may be compacted, decreasing the number of pin outs, without increasing the circuit element length, using a compactor. In accordance with one embodiment of the present invention, errors may be detected in scan chains used for integrated circuit testing. The number of outputs applied to output pins or other connectors may be substantially decreased, resulting in cost savings.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.