Patent · US Expired

Complementary metal gate electrode technology

US7187044B2 · kind B2 · utility

3Cited by
14References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 2, 2000
Grant dateMar 6, 2007
Priority date
Expiry dateMar 2, 2020

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D84/0177

Abstract

A method for making circuit device that includes a first transistor having a first metal gate electrode overlying a first gate dielectric on a first area of a semiconductor substrate. The first gate electrode has a work function corresponding to the work function of one of P-type silicon and N-type silicon. The circuit device also includes a second transistor coupled to the first transistor. The second transistor has a second metal gate electrode over a second gate dielectric on a second area of the semiconductor substrate. The second gate metal gate electrode has a work function corresponding to the work function of the other one of P-type silicon and N-type silicon.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.