Patent · US Expired

Error detecting circuit

US7188284B2 · kind B2 · utility

25Cited by
4References
28Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 30, 2004
Grant dateMar 6, 2007
Priority date
Expiry dateMar 18, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2029/3202
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

In one embodiment, an apparatus includes a datapath circuit to generate a data output signal in response to a data input signal and at least a first data clock signal; a shadow circuit, coupled to the datapath circuit, to generate a shadow output signal in response the data input signal and at least a second data clock signal during a functional mode of operation and to generate a scan-out signal in response to a scan-in signal and at least a first test clock signal during a test mode of operation; and an error detect circuit, coupled to the datapath and the shadow circuits, to generate an error signal in response to a mismatch between the data output signal and the shadow output signal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.