Scanning line detector for two-dimensional x-ray diffractometer
US7190762B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 29, 2004 |
| Grant date | Mar 13, 2007 |
| Priority date | — |
| Expiry date | Oct 29, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/5015
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A scanning line detector according to the present invention uses a detector with a linear arrangement of detection elements that is moved along a range of diffracted x-ray directions to collect data across a multidimensional detection area. The scanning line detector allows for the simulation of a two-dimensional detector system without the need for a two-dimensional detector. The detector may follow a desired path to simulate a desired shape, such as a cylinder. A slit may be included to limit the detector line width, and a scatter shield may be used to minimize noise from air-scattered x-rays. The detector may also use a specially designed monochromator for conditioning the diffracted x-rays. The detector may be rotatable about an axis parallel to a direction along which x-rays are diffracted, allowing it to be used in different orientations.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.