System and method for estimating reliability of components for testing and quality optimization
US7194366B2 · kind B2 · utility
12Cited by
18References
20Claims
0Family size
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Key dates
| Filing date | Oct 18, 2002 |
| Grant date | Mar 20, 2007 |
| Priority date | — |
| Expiry date | Jan 29, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/287
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and method for determining the early life reliability of an electronic component, including classifying the electronic component based on an initial determination of a number of fatal defects, and estimating a probability of latent defects present in the electronic component based on that classification with the aim of optimizing test costs and product quality.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.