Thomas S. Barnett
9Patents
5h-index
19Co-inventors
60Inventor score
Filing activity: Sep 24, 1979 → Mar 11, 2008
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6789032B2 | Method of statistical binning for reliability selection | Physics | 53 | Expired |
| US7194366B2 | System and method for estimating reliability of components for testing and quality optimization | Physics | 12 | Expired |
| US7416193B1 | Carpenter saw transporter assembly | Performing Operations; Transporting | 11 | Active |
| US7139944B2 | Method and system for determining minimum post production test time required on an integrated circuit device to achieve optimum reliability | Physics | 9 | Expired |
| US7917451B2 | Methods, apparatus, and program products to optimize semiconductor product yield prediction for performance and leakage screens | Physics | 6 | Active |
| USD263164S | Stove | General | 4 | Expired |
| US7409306B2 | System and method for estimating reliability of components for testing and quality optimization | Physics | 4 | Active |
| US6721995B2 | Hinge | Fixed Constructions | 2 | Expired |
| US7477961B2 | Equivalent gate count yield estimation for integrated circuit devices | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.