Patent · US Expired

Liquid crystal based polarimetric system, a process for the calibration of this polarimetric system, and a polarimetric measurement process

US7196792B2 · kind B2 · utility

6Cited by
4References
21Claims
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Key dates

Filing dateOct 15, 2003
Grant dateMar 27, 2007
Priority date
Expiry dateNov 1, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N21/211
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A liquid crystal based polarimetric system, a process for the calibration of this polarimetric system, and a polarimetric measurement process intended for measuring the representative parameters of a sample in which the polarimetric system contains an excitation section emitting a light beam that passes through a polarization state generator (PSG) and onto a sample. After reflection or transmission by the sample, the beam goes through an analysis section with a polarization state detector (PSD). The PSG and PSD each have a first and a second liquid crystal elements LCj (j=1,2) having, for each LCj element of the PSG (respectively for each LCj element of the PSD), an extraordinary axis making an angle θj (resp. θ′j) with respect to the polarization direction (i), and a retardation δj (resp (δ′j) between its ordinary and extraordinary axes, the liquid crystals LCj elements being positioned in reverse order in the PSD with respect to the LCj elements of the PSG.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.