Bernard Drevillon
21Patents
9h-index
27Co-inventors
75Inventor score
Filing activity: Jan 11, 1995 → Jan 13, 2014
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6657708B1 | Apparatus for optically characterising thin layered material | Physics | 62 | Expired |
| US7713779B2 | Photoactive nanocomposite and method for the production thereof | Emerging Cross-Sectional Technologies | 45 | Active |
| US5757671A | Multi-detector ellipsometer and process of multi-detector ellipsometric measurement | Physics | 30 | Expired |
| US6177995A | Polarimeter and corresponding measuring method | Physics | 25 | Expired |
| US5536936A | Spectroscopic ellipsometer modulated by an external excitation | Physics | 21 | Expired |
| US5485271A | Dual-modulation interferometric ellipsometer | Physics | 21 | Expired |
| US6175412A | Optical component for polarization modulation, a mueller polarimeter and ellipsometer containing such an optical component, a process for the calibration of this ellipsometer, and an ellipsometric measurement process | Physics | 18 | Expired |
| US5666200A | Method of ellipsometric measurement, an ellipsometer and device for controlling the carrying out of layers using such method and apparatus | Electricity | 14 | Expired |
| US6613434B1 | Method for treating polymer surface | Emerging Cross-Sectional Technologies | 14 | Expired |
| US7298480B2 | Broadband ellipsometer / polarimeter system | Physics | 8 | Expired |
| US7196792B2 | Liquid crystal based polarimetric system, a process for the calibration of this polarimetric system, and a polarimetric measurement process | Physics | 6 | Expired |
| US6914675B1 | Ellipsometric method and control device for making a thin-layered component | Physics | 3 | Expired |
| US7863113B2 | Transistor for active matrix display and a method for producing said transistor | Electricity | 3 | Active |
| US7859661B2 | Polarimetric Raman system and method for analysing a sample | Physics | 3 | Active |
| US8405830B2 | Device and method for taking spectroscopic polarimetric measurements in the visible and near-infrared ranges | Physics | 1 | Active |
| US9366694B2 | Microscope having a multimode local probe, tip-enhanced raman microscope, and method for controlling the distance between the local probe and the sample | Physics | 1 | Active |
| US6561198B1 | Method and installation for treating a metal part surface | Performing Operations; Transporting | 1 | Expired |
| US7046379B2 | Method for characterizing or controlling the production of a thin-layered component using optical methods | Physics | 1 | Expired |
| US8214024B2 | Electronic polarimetric imaging system for a colposcopy device and an adapter housing | Physics | 0 | Active |
| US6868312B2 | Method for real-time control of the fabrication of a thin-film structure by ellipsometric measurement | Physics | 0 | Expired |
| US7777880B2 | Metrological characterisation of microelectronic circuits | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.