Patent · US Expired

Supporting calibration and diagnostics in an open architecture test system

US7197416B2 · kind B2 · utility

5Cited by
12References
26Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 13, 2004
Grant dateMar 27, 2007
Priority date
Expiry dateFeb 2, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/31907
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for integrating test modules in a modular test system includes creating component categories for integrating vendor-supplied test modules and creating a calibration and diagnostics (C&D) framework for establishing a standard interface between the vendor-supplied test modules and the modular test system, where the C&D framework comprises interface classes communicating vendor-supplied module integration information. The method further includes receiving a vendor-supplied test module, retrieving module integration information from the vendor-supplied test module in accordance with the component categories, and integrating the vendor-supplied test module into the modular test system based on the module integration information using the C&D framework.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.