Patent · US Expired

Memory including a transfer gate and a storage element

US7200036B2 · kind B2 · utility

24Cited by
3References
8Claims
0Family size

Assignee

Inventor

Key dates

Filing dateOct 11, 2005
Grant dateApr 3, 2007
Priority date
Expiry dateOct 11, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B61/22
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Each memory cell is composed of a storage layer (2) for storing therein information based on the magnetization state of a magnetic material, a magnetization fixed layer (4) provided on the storage layer (2) through an intermediate layer (3), a storage element (10) for applying an electric current in the laminating layer direction to change the direction of magnetization of the storage layer (2) thereby to record information on the storage layer (2) and a memory cell including a selection transistor, wherein a polarity which requires a large amount of electric current to record information and a polarity by which a large amount of saturation electric current can be supplied to the selection transistor are made coincident with each other. A size of each memory cell including the selection transistor can be decreased to the minimum by suppressing influences of asymmetric property of a write electric current and a memory can integrate the memory cells at a high density.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.