Patent · US Expired

Array redundancy supporting multiple independent repairs

US7206236B1 · kind B1 · utility

1Cited by
1References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 12, 2006
Grant dateApr 17, 2007
Priority date
Expiry dateJan 12, 2026

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C29/848
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Arrays such as SRAMs, DRAMs, CAMs & Programmable ROMs having multiple independent failures are repaired using redundant bit lines. A first embodiment provides redundant bit lines on one side of the array. During a write, data is shifted towards the redundant bit lines on the one side of the array, bypassing failed bit lines. A second embodiment provides a spare bit line on each side of the array. During a write, a first failing bit line is replaced by a first spare bit line on a first side of the array, and a second failing bit line is replaced by a second spare bit line on a second side of the array.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.