Patent · US Expired

Memory structure for providing decreased leakage and bipolar current sensitivity

US7209394B1 · kind B1 · utility

5Cited by
5References
27Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 8, 2005
Grant dateApr 24, 2007
Priority date
Expiry dateNov 12, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2207/002
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A memory circuit. In one embodiment, the memory circuit includes a first one-hot multiplexer having a first plurality of local bitlines and a second one-hot multiplexer having a second plurality of local bitlines. Each of the first and second pluralities of local bitlines includes is coupled to a memory cell, and includes a passgate arranged on its respective local bitline to allow access to the cell. The first one-hot multiplexer and the second one-hot multiplexer are coupled together such that the highest order local bitline (i.e. corresponding the highest order bit in the group) is coupled to the lowest order bitline of the second one-hot multiplexer, and vice-versa.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.