Patent · US Expired

Integrating thermoelectric elements into wafer for heat extraction

US7211890B2 · kind B2 · utility

5Cited by
4References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 30, 2003
Grant dateMay 1, 2007
Priority date
Expiry dateJan 21, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

An embodiment of the present invention is a technique to provide heat extraction for semiconductor devices. At least a thermoelectric film is fabricated onto a bare wafer. The backside of the bare wafer is bonded to an active wafer having at least a device. The bonded bare and active wafers are annealed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.