Patent · US Expired

Process for producing aluminum-filled contact holes

US7214610B2 · kind B2 · utility

0Cited by
7References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 30, 2004
Grant dateMay 8, 2007
Priority date
Expiry dateSep 30, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/76877
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A process for producing aluminum-filled contact holes in a wafer is disclosed. The process uses a coating installation that includes a plurality of vacuum-processing chambers that are coupled to one another via at least one transfer chamber with an associated handler for transferring the wafers. The preferred process including forming the contact holes and depositing a barrier layer. The wafer is cooled to ambient temperature. A cold aluminum PVD coating process can then be carried out in a PVD-aluminum ESC chamber. After the wafer is heated (e.g., to a temperature of less than about 450° C.), a hot aluminum PVD deposition process is carried out in the PVD-aluminum ESC chamber.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.