Assembly and method for wavelength calibration in an echelle spectrometer

US7215422B2 · kind B2 · utility

Assignees

• Gesellschaft zur Forderung der analytischen Wissenschaften e.V. · DE
• Gesellschaft zur Förderung angewandter Optik, Optoelektronik, Quantenelektronik und Spektroskopie e.V. · DE

Inventors

• Stefan Florek · Berlin, DE
• Helmut Becker-Ross · Berlin, DE
• Uwe Heitmann · Hamburg, DE

Key dates

• Filing date: Jan 28, 2003
• Grant date: May 8, 2007
• Expiry date: Feb 26, 2024

Classification

• Technology area (CPC G): Physics
• CPC primary: G01J2003/2866
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A spectrometer assembly (10) is disclosed. The assembly includes a light source (11) with a continuous spectrum. A pre-monochromator (2) generates a spectrum with a relatively small linear dispersion from which a spectral portion is selectable, the spectral bandwidth of the spectral portion being smaller than or equal to the bandwidth of the free spectral range of the order in the echelle spectrum. The centre wavelength of the selected spectral interval is measurable with maximum blaze efficiency. The assembly also includes an echelle spectrometer (4) with means for wavelength calibration, an entrance slit (21) at the pre-monochromator (2), an intermediate slit assembly (50) with an intermediate slit (3) and a spatially resolving light detector (5) in the exit plane of the spectrometer for the detection of wavelength spectra.