X-ray micro-tomography system optimized for high resolution, throughput, image quality
US7215736B1 · kind B1 · utility
59Cited by
2References
14Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 4, 2005 |
| Grant date | May 8, 2007 |
| Priority date | — |
| Expiry date | Mar 4, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/419
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A projection x-ray imaging system that possibly utilizes a laboratory-based micro-focused x-ray source is disclosed. Techniques for optimizing the system for high quality, three dimensional image formation with tomographic imaging with the potential for high resolution and high throughput are described. It also concerns ways to optimize the system design to obtain improved image quality.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.