Method of inspecting a DNA chip
US7217573B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 4, 2000 |
| Grant date | May 15, 2007 |
| Priority date | — |
| Expiry date | Oct 4, 2020 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T436/143333
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of inspecting a DNA chip and an apparatus therefor that allow a picture to be reconstructed in the following steps: A plurality of irradiation spots are formed on a DNA probe array mounted on a stage. Then, the stage is displaced in X, Y directions so as to execute a scanning, thereby irradiating substantially all the entire surface of the DNA probe array. Next, a plurality of emitted fluorescent lights, which are generated from the plurality of irradiation spot portions on the DNA probe array, are converged and are then detected simultaneously by multi detectors. Finally, a data processing apparatus processes the detected signals, thereby reconstructing the picture.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.