Patent · US Expired

Electrostatic chucking stage and substrate processing apparatus

US7220319B2 · kind B2 · utility

16Cited by
10References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 15, 2003
Grant dateMay 22, 2007
Priority date
Expiry dateSep 12, 2023

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T279/23
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

This application discloses the structure of an ESC stage where a chucking electrode is sandwiched by a moderation layer and a covering layer. The moderation layer and the covering layer have the thermal expansion coefficients between the dielectric plate and the chucking electrode. This application also discloses the structure of an ESC stage where a chucking electrode is sandwiched by a moderation layer and a covering layer, which have internal stress directed oppositely to that of the chucking electrode. This application further discloses a substrate processing apparatus for carrying out a process onto a substrate as the substrate is maintained at a temperature higher than room temperature, comprising the electrostatic chucking stage for holding the substrate during the process.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.