Operation analyzing method for semiconductor integrated circuit device, analyzing system used in the same, and optimization design method using the same
US7225418B2 · kind B2 · utility
11Cited by
2References
38Claims
0Family size
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Key dates
| Filing date | Jun 9, 2004 |
| Grant date | May 29, 2007 |
| Priority date | — |
| Expiry date | Jan 13, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31928
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
There are contained the step of forming voltage waveform information by calculating a voltage waveform of each instance of a semiconductor integrated circuit at a power-supply terminal based on circuit information and analyzing the voltage waveform of each instance, the step of forming voltage abstraction information by abstracting the voltage waveform information, and the step of calculating a delay value of the instance based on the voltage abstraction information.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.