Patent · US Expired

Method of protecting wafer front pattern and method of performing double-sided process

US7235185B2 · kind B2 · utility

2Cited by
2References
7Claims
0Family size

Assignee

Inventor

Key dates

Filing dateNov 7, 2005
Grant dateJun 26, 2007
Priority date
Expiry dateNov 7, 2025

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/928
  • WIPO fieldMicro-structural and nano-technology
  • WIPO sectorChemistry

Abstract

A wafer comprising a front surface and a back surface is provided. The wafer further includes a front pattern on the front surface, the front pattern having a plurality of holes. A low-viscosity fluid is formed on the front surface and filled into the holes. Following that, a high-viscosity fluid is formed and filled into the holes by diffusion.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.