Patent · US Expired

Testing apparatus

US7237167B2 · kind B2 · utility

6Cited by
2References
5Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 6, 2004
Grant dateJun 26, 2007
Priority date
Expiry dateSep 3, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/3167
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A testing apparatus including a plurality of testing module slots to which different types of testing modules for testing a device under test are optionally mounted, includes a first and a second testing modules, and a synchronization controlling unit. The synchronization controlling unit includes an operation order holding unit for holding information indicating that a test operation by a first testing module should be performed before a test operation by a second testing module, a trigger return signal receiving unit for receiving a trigger return signal from the first testing module, and a trigger signal supplying unit for supplying a trigger signal to the second testing module, the trigger signal indicating that the second testing module should start the test operation thereof, when the trigger return signal receiving unit receives the trigger return signal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.