Patent · US Expired

Method and apparatus for current sense amplifier calibration in MRAM devices

US7239537B2 · kind B2 · utility

22Cited by
10References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 12, 2005
Grant dateJul 3, 2007
Priority date
Expiry dateJun 20, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2207/063
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A calibrated magnetic random access memory (MRAM) current sense amplifier includes a first plurality of trim transistors selectively configured in parallel with a first load device, the first load device associated with a data side of the sense amplifier. A second plurality of trim transistors is selectively configured in parallel with a second load device, the second load device associated with a reference side of the sense amplifier. The first and said second plurality of trim transistors are individually activated so as to compensate for device mismatch with respect to the data and reference sides of the sense amplifier.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.