Probe for near-field microscope, the method for manufacturing the probe and scanning probe microscope using the probe
US7241987B2 · kind B2 · utility
3Cited by
1References
4Claims
0Family size
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Key dates
| Filing date | Aug 3, 2005 |
| Grant date | Jul 10, 2007 |
| Priority date | — |
| Expiry date | Aug 3, 2025 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S977/862
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In a manufacture of a probe for a scattering type near-field microscope, there is provided a method of coating, with a high reproducibility, uniform metal particles efficiently inducing a surface enhanced Raman scattering. It has been adapted such that, in the probe for the scattering type near-field microscope, one part or all of the probe due to an interaction of at least an evanescent field is coated by metal particles which don't mutually adhere and have a particle diameter of 10 nm or larger and 50 nm or smaller in radius of curvature.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.