Masato Iyoki
18Patents
5h-index
21Co-inventors
62Inventor score
Filing activity: Jun 21, 1999 → Aug 23, 2013
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6257053A | Scanning probe microscope having piezoelectric member for controlling movement of probe | Emerging Cross-Sectional Technologies | 22 | Expired |
| US8024816B2 | Approach method for probe and sample in scanning probe microscope | Physics | 7 | Active |
| US7288762B2 | Fine-adjustment mechanism for scanning probe microscopy | Emerging Cross-Sectional Technologies | 7 | Expired |
| US7170054B2 | Scanning probe microscopy cantilever holder and scanning probe microscope using the cantilever holder | Physics | 6 | Expired |
| US7973942B2 | Optical displacement detection mechanism and surface information measurement device using the same | Physics | 6 | Active |
| US8813261B2 | Scanning probe microscope | Physics | 4 | Active |
| US7605368B2 | Vibration-type cantilever holder and scanning probe microscope | Physics | 3 | Active |
| US7241987B2 | Probe for near-field microscope, the method for manufacturing the probe and scanning probe microscope using the probe | Emerging Cross-Sectional Technologies | 3 | Expired |
| US7787133B2 | Optical displacement-detecting mechanism and probe microscope using the same | Performing Operations; Transporting | 2 | Active |
| US8115367B2 | Piezoelectric actuator provided with a displacement meter, piezoelectric element, and positioning device | Electricity | 2 | Active |
| US8214915B2 | Cantilever, cantilever system, scanning probe microscope, mass sensor apparatus, viscoelasticity measuring instrument, manipulation apparatus, displacement determination method of cantilever, vibration method of cantilever and deformation method of cantilever | Physics | 2 | Active |
| US7282157B2 | Method of manufacturing light-propagating probe for near-field microscope | Physics | 2 | Expired |
| US7614288B2 | Scanning probe microscope fine-movement mechanism and scanning probe microscope using same | Physics | 1 | Active |
| US8058780B2 | Circular cylinder type piezoelectric actuator and piezoelectric element and scanning probe microscope using those | Physics | 1 | Active |
| US7614287B2 | Scanning probe microscope displacement detecting mechanism and scanning probe microscope using same | Physics | 1 | Active |
| US8161568B2 | Self displacement sensing cantilever and scanning probe microscope | Physics | 1 | Active |
| US7945965B2 | Sensor for observations in liquid environments and observation apparatus for use in liquid environments | Physics | 1 | Active |
| US8601608B2 | Cantilever for scanning probe microscope and scanning probe microscope equipped with it | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.