Method for localization and generation of short critical sequence
US7246291B2 · kind B2 · utility
2Cited by
3References
17Claims
0Family size
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Key dates
| Filing date | May 4, 2004 |
| Grant date | Jul 17, 2007 |
| Priority date | — |
| Expiry date | Apr 12, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/54
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for localization and generation of short critical sequence uses an automatic test equipment to test an electronic device (e.g., memory device) by circuit simulation to localize and re-generate a very short critical sequence from a set of long worst-case pattern. The method includes defining a failure mechanism condition for search and localization process and re-production of the short critical sequence based on a mutation process from the critical sequence detected from a step (I) phase and number of pattern defined in population using a genetic algorithm step (II) phase.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.